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NE4000​

Electron Beam Absorbed Current (EBAC) Characterization System nanoEBAC​

The Hitachi NE4000 nanoEBAC is an electron beam based probing system for electrical characterization and EBAC analysis and imaging of microelectronic device interconnects, materials, and components.​

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  • Features
  • Resources

| User-Friendly Design

| Premium Image Quality

EBAC image of LSI’s net using Hitachi’s original EBAC amplifier (courtesy of Renesas electronics corporation)

| Outstanding Performance

High quality and high resolution imaging with refined nano-probe precision

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