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Hitachi's general-purpose atomic force microscope, Model AFM5100N, features superior ease of use, a wide range of capabilities, and extraordinary performance. The breakthrough hardware option, the self-sensing detector, doesn't require laser and detector alignments and thus can effectively simplify AFM operation. As a full-featured system in support of high-resolution and multifunctional AFM measurements, the AFM5100N offers a wide variety of advanced modes, including the proprietary sampling intelligent scan (SIS), which delivers previously unattainable results for very challenging samples.
Conventional levers are very small and difficult to grip, but the internal sensor type lever is large, easily gripped, and installation is simple.
|Self detection method of laser optic axis adjustment unnecessary
With the optic lever method, adjustment is required to align the laser axis to the cantilever but this is not required if employing the self detection method.
|Accurate positioning by pin-point type cantilever
The cantilever is structured to allow verification from directly above the position of the probe tip. Positioning of measurement spots is easy. Further, high resolution is acheived by sharpening the probe.
|Easy operation by Navigation System
Anybody can smoothly observe high resolution surfaces with the flow chart format navigation system. Further, by intuitively answering questions of sample hardness or roughness, measurement parameters can be easily set.
|Small form factor for flexible, efficient space usage
|Superior Function Expandability
Various functions can be expanded by adding alignment of the optic lever method . Also, change to the light lever method is completed by inserting one cable.
